Citation: It. Sylla et al., A unity gain high speed buffer to improve signal integrity in high frequency test interface, J ELEC TEST, 17(1), 2001, pp. 53-61
Authors:
Pyrzynska, B
Lis, A
Mosieniak, G
Kaminska, B
Citation: B. Pyrzynska et al., Cyclosporin A-sensitive signaling pathway involving calcineurin regulates survival of reactive astrocytes, NEUROCHEM I, 38(5), 2001, pp. 409-415
Authors:
Kaminska, B
Figiel, I
Pyrzynska, B
Czajkowski, R
Mosieniak, G
Citation: B. Kaminska et al., Treatment of hippocampal neurons with cyclosporin A results in calcium overload and apoptosis which are independent on NMDA receptor activation, BR J PHARM, 133(7), 2001, pp. 997-1004
Authors:
Fiedorowicz, A
Figiel, L
Kaminska, B
Zaremba, M
Wilk, S
Oderfeld-Nowak, B
Citation: A. Fiedorowicz et al., Dentate granule neuron apoptosis and glia activation in murine hippocampusinduced by trimethyltin exposure, BRAIN RES, 912(2), 2001, pp. 116-127
Citation: K. Arabi et B. Kaminska, Design and realization of a built-in current sensor for I-DDQ testing and power dissipation measurement, ANALOG IN C, 23(2), 2000, pp. 117-126
Authors:
Kaminska, B
Pyrzynska, B
Ciechomska, I
Wisniewska, M
Citation: B. Kaminska et al., Modulation of the composition of AP-1 complex and its impact on transcriptional activity, ACT NEUROB, 60(3), 2000, pp. 395-402
Citation: B. Pyrzynska et al., Changes of the trans-activating potential of AP-1 transcription factor during cyclosporin A-induced apoptosis of glioma cells are mediated by phosphorylation and alterations of AP-1 composition, J NEUROCHEM, 74(1), 2000, pp. 42-51
Authors:
Kaminska, B
Kaczmarek, L
Zangenehpour, S
Chaudhuri, A
Citation: B. Kaminska et al., Rapid phosphorylation of Elk-1 transcription factor and activation of MAP kinase signal transduction pathways in response to visual stimulation, MOL CELL NE, 13(6), 1999, pp. 405-414
Authors:
Boubezari, S
Cerny, E
Kaminska, B
Nadeau-Dostie, B
Citation: S. Boubezari et al., Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST, IEEE COMP A, 18(9), 1999, pp. 1327-1340
Citation: A. Abderrahman et al., Worst case tolerance analysis and CLP-based multifrequency test generationfor analog circuits, IEEE COMP A, 18(3), 1999, pp. 332-345