Citation: Hc. Kan et Rj. Phaneuf, Focusing of low energy electrons by submicrometer patterned structures in low energy electron microscopy, J VAC SCI B, 19(4), 2001, pp. 1158-1163
Authors:
Phaneuf, RJ
Kan, HC
Marsi, M
Gregoratti, L
Gunther, S
Kiskinova, M
Citation: Rj. Phaneuf et al., Imaging the variation in band bending across a silicon pn junction surfaceusing spectromicroscopy, J APPL PHYS, 88(2), 2000, pp. 863-868