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Citation: L. Troger et al., Measurements of photon interference X-ray absorption fine structure (pi XAFS), J SYNCHROTR, 8, 2001, pp. 105-109

Authors: Grunwaldt, JD Kappen, P Hammershoi, BS Troger, L Clausen, BS

Citation: Jd. Grunwaldt et al., Fluorescence EXAFS for the in situ study on the state of promoters in catalysis, J SYNCHROTR, 8, 2001, pp. 572-574

Authors: Kappen, P Troger, L Hansen, K Reckleben, C Lechner, P Strssuder, L Materlik, G

Citation: P. Kappen et al., Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications, NUCL INST A, 467, 2001, pp. 1163-1166

Authors: Kappen, P Grunwaldt, JD Hammershoi, BS Troger, L Clausen, BS

Citation: P. Kappen et al., The state of Cu promoter atoms in high-temperature shift catalysts - An insitu fluorescence XAFS study, J CATALYSIS, 198(1), 2001, pp. 56-65

Authors: Kappen, P Reihs, K Seidel, C Voetz, M Fuchs, H

Citation: P. Kappen et al., Overlayer thickness determination by angular dependent X-ray photoelectronspectroscopy (ADXPS) of rough surfaces with a spherical topography, SURF SCI, 465(1-2), 2000, pp. 40-50