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Results:
1-7
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Results: 7
Authors:
Chikaura, Y
Iida, S
Kawado, S
Mizuno, K
Kimura, S
Matsui, J
Umeno, M
Ozaki, T
Shimura, T
Suzuki, Y
Izumi, K
Kawasaki, K
Kajiwara, K
Ishikawa, T
Citation: Y. Chikaura et al., Construction of topography stations at SPring-8 and first observations, J PHYS D, 34(10A), 2001, pp. A158-A162
Authors:
Kudo, Y
Liu, KY
Kawado, S
Xiaowei, Z
Hirano, K
Citation: Y. Kudo et al., Characterization of process-induced lattice distortion in silicon by double-crystal x-ray topography using a curved collimator, J APPL PHYS, 90(2), 2001, pp. 670-674
Authors:
Kudo, Y
Liu, KY
Kawado, S
Kashiwagi, A
Hirano, K
Citation: Y. Kudo et al., Determination of the density and the thickness of SiO2 films using extremely asymmetric X-ray diffraction, JPN J A P 1, 39(3A), 2000, pp. 1409-1413
Authors:
Awaji, N
Ozaki, S
Nishino, J
Noguchi, S
Yamamoto, T
Syoji, T
Yamagami, M
Kobayashi, A
Hirai, Y
Shibata, M
Yamaguchi, K
Liu, KY
Kawado, S
Takahashi, M
Yasuami, S
Konomi, I
Kimura, S
Hirai, Y
Hasegawa, M
Komiya, S
Hirose, T
Okajima, T
Citation: N. Awaji et al., Wavelength-dispersive total reflection X-ray fluorescence with high-brilliance undulator radiation at SPring-8, JPN J A P 2, 39(12A), 2000, pp. L1252-L1255
Authors:
Kudo, Y
Liu, KY
Kawado, S
Hirano, K
Citation: Y. Kudo et al., Elimination of extrinsic components overlapping lattice distortion variations of a silicon single crystal obtained by double-crystal X-ray topography, J APPL CRYS, 33, 2000, pp. 226-233
Authors:
Kawado, S
Citation: S. Kawado, Recent progress in x-ray topography for silicon materials, JPN J A P 1, 38, 1999, pp. 520-525
Authors:
Sasaki, TA
Harami, T
Mizuki, J
Iida, A
Kawado, S
Citation: Ta. Sasaki et al., Proceedings of the Second International Conference on Synchrotron Radiation in Materials Science - SRMS-2 - October 31-November 3, 1998, Kobe, Japan - Preface, JPN J A P 1, 38, 1999, pp. III-IV
Risultati:
1-7
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