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Results:
1-7
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Results: 7
Authors:
Kruger, S
Wernicke, G
Osten, W
Kayser, D
Demoli, N
Gruber, H
Citation: S. Kruger et al., Fault detection and feature analysis in interferometric fringe patterns bythe application of wavelet filters in convolution processors, J ELECTR IM, 10(1), 2001, pp. 228-233
Authors:
Passow, T
Heinke, H
Kayser, D
Leonardi, K
Hommel, D
Citation: T. Passow et al., Growth of (Zn)CdSe quantum structures on vicinal GaAs(001) substrates: step flow growth versus strain effects, J CRYST GR, 214, 2000, pp. 606-609
Authors:
Kayser, D
Khodja, M
Marguerite, G
Citation: D. Kayser et al., Delivery by a Tec 6 (TM) vaporizer of desflurane vapour above the dialled-in concentration., ANN FR A R, 18(6), 1999, pp. 691-693
Authors:
Osten, W
Andra, P
Kayser, D
Citation: W. Osten et al., Highly-resolved measurement of extended technical surfaces with scalable topometry, TEC MES, 66(11), 1999, pp. 413-428
Authors:
Kayser, D
Vosniadou, S
Nedellec, C
Saitta, L
Tiberghien, A
Zucker, JD
Citation: D. Kayser et al., Modelling changes in understanding - Case studies in physical reasoning - General overview, ADV LEARN I, 1999, pp. 1-14
Authors:
Vosniadou, S
Kayser, D
Champesme, M
Ioannides, C
Dimitracopoulou, A
Citation: S. Vosniadou et al., Modelling elementary school students' solution of mechanics problems, ADV LEARN I, 1999, pp. 61-105
Authors:
Diener, W
Kayser, D
Schlede, E
Citation: W. Diener et al., The dermal acute toxic class method: test procedures and biometric evaluations, ARCH TOXIC, 72(12), 1998, pp. 751-762
Risultati:
1-7
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