Authors:
Cai, SJ
Tang, YS
Li, R
Wei, YY
Wong, L
Chen, YL
Wang, KL
Chen, M
Zhao, YF
Schrimpf, RD
Keay, JC
Galloway, KF
Citation: Sj. Cai et al., Annealing behavior of a proton irradiated AlxGa1-xN/GaN high electron mobility transistor grown by MBE, IEEE DEVICE, 47(2), 2000, pp. 304-307