Citation: T. Friessnegg et al., Detection of oxygen vacancies in (Pb,La)(Zr,Ti)O-3 thin film capacitors using positron annihilation, INTEGR FERR, 32(1-4), 2001, pp. 871-889
Authors:
Persheyev, SK
Goldie, DM
Gibson, RAG
Rose, MJ
Anthony, S
Keeble, DJ
Robb, K
Main, C
Reynolds, S
Zrinscak, I
Citation: Sk. Persheyev et al., Depth profiling and the effect of oxygen and carbon on the photoelectricalproperties of amorphous silicon films deposited using tungsten wire filaments, THIN SOL FI, 395(1-2), 2001, pp. 130-133
Authors:
Friessnegg, T
Aggarwal, S
Nielsen, B
Ramesh, R
Keeble, DJ
Poindexter, EH
Citation: T. Friessnegg et al., A study of vacancy-related defects in (Pb,La)(Zr,Ti)O-3 thin films using positron annihilation, IEEE ULTRAS, 47(4), 2000, pp. 916-920
Authors:
Friessnegg, T
Aggarwal, S
Ramesh, R
Nielsen, B
Poindexter, EH
Keeble, DJ
Citation: T. Friessnegg et al., Vacancy formation in (Pb,La)(Zr,Ti)O-3 capacitors with oxygen deficiency and the effect on voltage offset, APPL PHYS L, 77(1), 2000, pp. 127-129