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Results: 1-25/43
Authors:
Keil, M
Heun, M
Austin, J
Lahoz, W
Lou, GP
O'Neill, A
Citation: M. Keil et al., The use of long-duration balloon data to determine the accuracy of stratospheric analyses and forecasts, J GEO RES-A, 106(D10), 2001, pp. 10299-10312
Authors:
Samori, P
Keil, M
Friedlein, R
Birgerson, J
Watson, M
Mullen, M
Salaneck, WR
Rabe, JP
Citation: P. Samori et al., Growth of ordered hexakis-dodecyl-hexabenzoeoronene layers from solution: A SFM and ARUPS study, J PHYS CH B, 105(45), 2001, pp. 11114-11119
Authors:
Wang, CZ
Maier, UH
Eisenreich, W
Adam, P
Obersteiner, I
Keil, M
Bacher, A
Zenk, MH
Citation: Cz. Wang et al., Unexpected biosynthetic precursors of amarogentin - A retrobiosynthetic C-13 NMR study, EUR J ORG C, (8), 2001, pp. 1459-1465
Authors:
Kaufmann, O
Ekers, A
Gebauer-Rochholz, C
Mettendorf, KU
Keil, M
Bergmann, K
Citation: O. Kaufmann et al., Dissociative charge transfer from highly excited Na Rydberg atoms to vibrationally excited Na-2 molecules, INT J MASS, 205(1-3), 2001, pp. 233-242
Authors:
Demtroder, W
Keil, M
Wenz, H
Citation: W. Demtroder et al., Laser spectroscopy of small molecules, ADV ATOM MO, 45, 2001, pp. 149-201
Authors:
Smith, HJ
Keil, M
Depledge, G
Citation: Hj. Smith et al., Keeping mum as the project goes under: Toward an explanatory model, J MANAG I S, 18(2), 2001, pp. 189-227
Authors:
Schmidt, R
Lyytinen, K
Keil, M
Cule, P
Citation: R. Schmidt et al., Identifying software project risks: An international Delphi study, J MANAG I S, 17(4), 2001, pp. 5-36
Authors:
Greczynski, G
Kugler, T
Keil, M
Osikowicz, W
Fahlman, M
Salaneck, WR
Citation: G. Greczynski et al., Photoelectron spectroscopy of thin films of PEDOT-PSS conjugated polymer blend: a mini-review and some new results, J ELEC SPEC, 121(1-3), 2001, pp. 1-17
Authors:
Keil, M
Schoeller, H
Citation: M. Keil et H. Schoeller, The real-time renormalization group approach for the spin-boson model in nonequilibrium, CHEM PHYS, 268(1-3), 2001, pp. 11-20
Authors:
Alam, MS
Ciocio, A
Einsweiler, K
Emes, J
Gilchriese, M
Joshi, A
Kleinfelder, S
Marchesini, R
McCormack, F
Milgrome, O
Palaio, N
Pengg, F
Ricardson, J
Zizka, G
Ackers, M
Andreazza, A
Comes, G
Fischer, P
Keil, M
Klasen, V
Kuhl, T
Meuser, S
Ockenfels, W
Raith, B
Treis, J
Wermes, N
Gossling, C
Hugging, F
Wustenfeld, J
Wunstorf, R
Barberis, D
Beccherle, R
Darbo, G
Gagliardi, G
Gemme, C
Morettini, P
Musico, P
Osculati, B
Parodi, F
Rossi, L
Blanquart, L
Breugnon, P
Calvet, D
Clemens, JC
Delpierre, P
Hallewell, G
Laugier, D
Mouthuy, T
Rozanov, A
Valin, I
Aleppo, M
Caccia, M
Ragusa, F
Troncon, C
Lutz, G
Richter, RH
Rohe, T
Brandl, A
Gorfine, G
Hoeferkamp, M
Seidel, SC
Boyd, GR
Skubic, PL
Sicho, P
Tomasek, L
Vrba, V
Holder, M
Ziolkowski, M
D'Auria, S
del Papa, C
Charles, E
Fasching, D
Becks, KH
Lenzen, G
Linder, C
Citation: Ms. Alam et al., The ATLAS silicon pixel sensors, NUCL INST A, 456(3), 2001, pp. 217-232
Authors:
Keil, M
Schoeller, H
Citation: M. Keil et H. Schoeller, Real-time renormalization-group analysis of the dynamics of the spin-bosonmodel - art. no. 180302, PHYS REV B, 6318(18), 2001, pp. 0302
Authors:
Celma, CR
Palazon, J
Cusido, RM
Pinol, MT
Keil, M
Citation: Cr. Celma et al., Decreased scopolamine yield in field-grown Duboisia plants regenerated from hairy roots, PLANTA MED, 67(3), 2001, pp. 249-253
Authors:
Fortin, P
Keil, M
Symons, J
Citation: P. Fortin et al., The sources of unemployment in Canada, 1967-91: evidence from a panel of regions and demographic groups, OX ECON PAP, 53(1), 2001, pp. 67-93
Authors:
Meyer, W
Keil, M
Kudell, A
Baig, MA
Zhu, J
Demtroder, W
Citation: W. Meyer et al., The hyperfine structure in the electronic A E-2 '<- X E-2 ' system of the pseudorotating lithium trimer, J CHEM PHYS, 115(6), 2001, pp. 2590-2602
Authors:
Luo, Y
Agren, H
Keil, M
Friedlein, R
Salaneck, WR
Citation: Y. Luo et al., A theoretical investigation of the near-edge X-ray absorption spectrum of hexa-peri-hexabenzocoronene, CHEM P LETT, 337(1-3), 2001, pp. 176-180
Authors:
Keil, M
Robey, D
Citation: M. Keil et D. Robey, Blowing the whistle on troubled software projects - Despite inevitable personal risk, auditors owe their organizations accurate information about project status, especially bad news, in the interests of halting software project runaways. Management owes them the courtesy of listening., COMM ACM, 44(4), 2001, pp. 87-93
Authors:
Brickmann, J
Exner, TE
Keil, M
Marhofer, RJ
Citation: J. Brickmann et al., Molecular graphics - Trends and perspectives, J MOL MODEL, 6(2), 2000, pp. 328-340
Authors:
Keil, M
Samori, P
dos Santos, DA
Kugler, T
Stafstrom, S
Brand, JD
Mullen, K
Bredas, JL
Rabe, JP
Salaneck, WR
Citation: M. Keil et al., Influence of the morphology on the electronic structure of hexa-peri-hexabenzocoronene thin films, J PHYS CH B, 104(16), 2000, pp. 3967-3975
Authors:
Larson, PR
Copeland, KA
Dharmasena, G
Lasell, RA
Keil, M
Johnson, MB
Citation: Pr. Larson et al., Atomic fluorine beam etching of silicon and related materials, J VAC SCI B, 18(1), 2000, pp. 307-312
Authors:
Montealegre, R
Keil, M
Citation: R. Montealegre et M. Keil, De-escalating information technology projects: Lessons from the denver international airport, MIS QUART, 24(3), 2000, pp. 417-447
Authors:
Keil, M
Tan, BCY
Wei, KK
Saarinen, T
Tuunainen, V
Wassenaar, A
Citation: M. Keil et al., A cross-cultural study on escalation of commitment behavior in software projects, MIS QUART, 24(2), 2000, pp. 299-325
Authors:
Keil, M
Mount, DM
Wismath, SK
Citation: M. Keil et al., Visibility stabs and depth-first spiralling on line segments in output sensitive time, INT J C GEO, 10(5), 2000, pp. 535-552
Authors:
Blanquart, L
Bonzom, V
Comes, G
Delpierre, P
Fischer, P
Hausmann, J
Keil, M
Lindner, M
Meuser, S
Wermes, N
Citation: L. Blanquart et al., Pixel readout electronics for LHC and biomedical applications, NUCL INST A, 439(2-3), 2000, pp. 403-412
Authors:
Berg, C
Blanquart, L
Bonzom, V
Delpierre, P
Desch, K
Fischer, P
Keil, M
Meuser, S
Raith, B
Wermes, N
Citation: C. Berg et al., Bier&Pastis, a pixel readout prototype chip for LHC, NUCL INST A, 439(1), 2000, pp. 80-90
Authors:
Keil, M
Wallace, L
Turk, D
Dixon-Randall, G
Nulden, U
Citation: M. Keil et al., An investigation of risk perception and risk propensity on the decision tocontinue a software development project, J SYST SOFT, 53(2), 2000, pp. 145-157