Authors: Carrey, J Bouzehouane, K George, JM Ceneray, C Fert, A Vaures, A Kenane, S Piraux, L

Citation: J. Carrey et al., Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition, APPL PHYS L, 79(19), 2001, pp. 3158-3160