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Results:
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Results: 2
MOS transistor reliability under analog operation
Authors:
Thewes, R Brederlow, R Schlunder, C Wieczorek, P Ankele, B Hesener, A Holz, J Kessel, S Weber, W
Citation:
R. Thewes et al., MOS transistor reliability under analog operation, MICROEL REL, 40(8-10), 2000, pp. 1545-1554
Trapping mechanisms in negative bias temperature stressed p-MOSFETs
Authors:
Schlunder, C Brederlow, R Wieczorek, P Dahl, C Holz, J Rohner, M Kessel, S Herold, V Goser, K Weber, W Thewes, R
Citation:
C. Schlunder et al., Trapping mechanisms in negative bias temperature stressed p-MOSFETs, MICROEL REL, 39(6-7), 1999, pp. 821-826
Risultati:
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