Authors: Khlifi, Y Kassmi, K Roubi, L Maimouni, R

Citation: Y. Khlifi et al., Modeling of current-voltage characteristics of metal/ultra-thin oxide/semiconductor structures, EPJ-APPL PH, 9(3), 2000, pp. 239-246

Authors: Khlifi, Y Kassmi, K Roubi, L Maimouni, R

Citation: Y. Khlifi et al., Fowler-Nordheim current oscillations analysis of metal/ultra-thin oxide/semiconductor structures, PHYS ST S-A, 182(2), 2000, pp. 737-753