Authors: Lee, WP Khong, YL

Citation: Wp. Lee et Yl. Khong, Silicon wafer surface passivation by low-temperature oxidation prior to ultraviolet radiation for photoconductive decay measurement, J APPL PHYS, 87(11), 2000, pp. 7845-7847

Authors: Khong, YL Lee, HL

Citation: Yl. Khong et Hl. Lee, Chemical imaging of micro-vias in organic packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 154-158

Authors: Lee, WP Khong, YL Seow, WS

Citation: Wp. Lee et al., Modelling the ultraviolet irradiation effect on the effective minority carrier recombination lifetime of silicon wafers, J APPL PHYS, 85(2), 1999, pp. 994-1001