Authors: Snyder, JE Lo, CCH Chen, R Kriegermeier-Sutton, B Leib, J Lee, SJ Kremer, MJ Jiles, DC Kief, MT

Citation: Je. Snyder et al., The effect of nitrogen on the microstructure, stress, and magnetic properties of RF-sputtered FeSiAl(N) thin films, J MAGN MAGN, 226, 2001, pp. 1669-1671

Authors: Lo, CCH Snyder, JE Leib, J Chen, R Kriegermeier-Sutton, B Kramer, MJ Jiles, DC Kief, MT

Citation: Cch. Lo et al., Magnetic force microscopy study of magnetization reversal in sputtered FeSiAl(N) films, J APPL PHYS, 89(5), 2001, pp. 2868-2872

Authors: Zhang, K Kai, T Zhao, T Fujiwara, H Hou, C Kief, MT

Citation: K. Zhang et al., Rotational hysteresis of torque curves in polycrystalline ferro/antiferromagnetic systems, J APPL PHYS, 89(11), 2001, pp. 7546-7548

Authors: Hou, CH Chen, J Kief, MT Gao, Z Mao, SN Pokhil, T

Citation: Ch. Hou et al., Dispersion of the pinning field direction of a ferromagnet/antiferromagnetcoupled system, APPL PHYS L, 78(2), 2001, pp. 237-239

Authors: Qian, ZH Kief, MT George, PK Sivertsen, JM Judy, JH

Citation: Zh. Qian et al., Kerr effect observations of magnetization reversal process in antiferromagnetically pinned permalloy thin films, J APPL PHYS, 85(8), 1999, pp. 5525-5527

Authors: Talghader, V Kief, MT Al-Jumaily, G

Citation: V. Talghader et al., On the use of x-ray reflectivity and the second-harmonic magneto-optic Kerr effect for characterizing buried magnetic interfaces, J APPL PHYS, 85(8), 1999, pp. 4586-4588