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Results:
1-8
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Results: 8
Authors:
Piazza, F
Arnal, Y
Grambole, D
Herrmann, F
Kildemo, M
Lacoste, A
Relihan, G
Golanski, A
Citation: F. Piazza et al., Influence of the process parameters on the properties of hydrogenated amorphous carbon thin films deposited using ECR plasma, THIN SOL FI, 383(1-2), 2001, pp. 196-199
Authors:
Ramsvik, T
Borg, A
Kildemo, M
Raaen, S
Matsuura, A
Jaworowski, AJ
Worren, T
Leandersson, M
Citation: T. Ramsvik et al., Molecular vibrations in core-ionised CO adsorbed on Co(0001) and Rh(100), SURF SCI, 492(1-2), 2001, pp. 152-160
Authors:
Kildemo, M
Ramsvik, T
Raaen, S
Citation: M. Kildemo et al., Investigation of the La-Rh(100) surface alloy, SURF SCI, 490(1-2), 2001, pp. 1-12
Authors:
Kildemo, M
Hunderi, O
Citation: M. Kildemo et O. Hunderi, Spectroscopic Fourier methods for thickness measurements of thick uniaxialwafers, with dispersive birefringence, using polarimetric techniques, J OPT A-P A, 2(5), 2000, pp. L33-L37
Authors:
Moriarty, GR
Kildemo, M
Beechinor, JT
Murtagh, M
Kelly, PV
Crean, GM
Bland, SW
Citation: Gr. Moriarty et al., Optical and structural properties of InGaP heterostructures, THIN SOL FI, 364(1-2), 2000, pp. 244-248
Authors:
Kildemo, M
Mooney, M
Sudre, C
Kelly, PV
Citation: M. Kildemo et al., Investigation of a half-wave method for birefringence or thickness measurements of a thick, semitransparent, uniaxial, anisotropic substrate by use of spectroscopic ellipsometry, APPL OPTICS, 39(25), 2000, pp. 4649-4657
Authors:
Ossikovski, R
Kildemo, M
Stchakovsky, M
Mooney, M
Citation: R. Ossikovski et al., Anisotropic incoherent reflection model for spectroscopic ellipsometry of a thick semitransparent anisotropic substrate, APPL OPTICS, 39(13), 2000, pp. 2071-2077
Authors:
Kildemo, M
Dalsrud, V
Fostad, O
Citation: M. Kildemo et al., Measurement of physical thicknesses in micromachined structures consistingof glass and c-Si, by Fourier transform infrared reflection, OPT ENG, 38(9), 1999, pp. 1542-1552
Risultati:
1-8
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