AAAAAA

   
Results: 1-25 | 26-30 |
Results: 26-30/30
An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique
Authors: Kim, SH Kim, DJ Lee, KM Park, M Kingon, AI Nemanich, RJ Im, J Streiffer, SK
Citation: Sh. Kim et al., An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique, J MATER RES, 14(11), 1999, pp. 4395-4401
Ferroelectricity in thin films: The dielectric response of fiber-textured (BaxSr1-x)Ti1+yO3+z thin films grown by chemical vapor deposition
Authors: Streiffer, SK Basceri, C Parker, CB Lash, SE Kingon, AI
Citation: Sk. Streiffer et al., Ferroelectricity in thin films: The dielectric response of fiber-textured (BaxSr1-x)Ti1+yO3+z thin films grown by chemical vapor deposition, J APPL PHYS, 86(8), 1999, pp. 4565-4575
Studies of hydrogen-induced degradation processes in SrBi2Ta2O9 ferroelectric film-based capacitors
Authors: Im, J Auciello, O Krauss, AR Gruen, DM Chang, RPH Kim, SH Kingon, AI
Citation: J. Im et al., Studies of hydrogen-induced degradation processes in SrBi2Ta2O9 ferroelectric film-based capacitors, APPL PHYS L, 74(8), 1999, pp. 1162-1164
Accommodation of nonstoichiometry in (100) fiber-textured (BaxSr1-x)Ti1-yO3+z thin films grown by chemical vapor deposition
Authors: Stemmer, S Streiffer, SK Browning, ND Kingon, AI
Citation: S. Stemmer et al., Accommodation of nonstoichiometry in (100) fiber-textured (BaxSr1-x)Ti1-yO3+z thin films grown by chemical vapor deposition, APPL PHYS L, 74(17), 1999, pp. 2432-2434
Piezoelectric measurements with atomic force microscopy
Authors: Christman, JA Woolcott, RR Kingon, AI Nemanich, RJ
Citation: Ja. Christman et al., Piezoelectric measurements with atomic force microscopy, APPL PHYS L, 73(26), 1998, pp. 3851-3853
Risultati: 1-25 | 26-30 |