Citation: Y. Gogotsi et al., Raman microspectroscopy study of processing-induced phase transformations and residual stress in silicon (vol 14, pg 936, 1999), SEMIC SCI T, 14(11), 1999, pp. 1019-1019
Citation: Y. Gogotsi et al., Raman microspectroscopy study of processing-induced phase transformations and residual stress in silicon, SEMIC SCI T, 14(10), 1999, pp. 936-944