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Results:
1-3
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Results: 3
Authors:
Park, JE
Schroder, DK
Tan, SE
Choi, BD
Fletcher, M
Buczkowski, A
Kirscht, F
Citation: Je. Park et al., Silicon epitaxial layer lifetime characterization, J ELCHEM SO, 148(8), 2001, pp. G411-G419
Authors:
Gogotsi, Y
Baek, C
Kirscht, F
Citation: Y. Gogotsi et al., Raman microspectroscopy study of processing-induced phase transformations and residual stress in silicon (vol 14, pg 936, 1999), SEMIC SCI T, 14(11), 1999, pp. 1019-1019
Authors:
Gogotsi, Y
Baek, C
Kirscht, F
Citation: Y. Gogotsi et al., Raman microspectroscopy study of processing-induced phase transformations and residual stress in silicon, SEMIC SCI T, 14(10), 1999, pp. 936-944
Risultati:
1-3
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