Authors:
Lubyshev, D
Liu, WK
Stewart, TR
Cornfeld, AB
Fang, XM
Xu, X
Specht, P
Kisielowski, C
Naidenkova, M
Goorsky, MS
Whelan, CS
Hoke, WE
Marsh, PF
Millunchick, JM
Svensson, SP
Citation: D. Lubyshev et al., Strain relaxation and dislocation filtering in metamorphic high electron mobility transistor structures grown on GaAs substrates, J VAC SCI B, 19(4), 2001, pp. 1510-1514
Authors:
Schwander, P
Rau, WD
Kisielowski, C
Gribelyuk, M
Ourmazd, A
Citation: P. Schwander et al., Defect processes in semiconductors studied at the atomic level by transmission electron microscopy, SEM SEMIMET, 51, 1999, pp. 225-259