Defect processes in semiconductors studied at the atomic level by transmission electron microscopy

Authors
Schwander, P Rau, WD Kisielowski, C Gribelyuk, M Ourmazd, A
Citation
P. Schwander et al., Defect processes in semiconductors studied at the atomic level by transmission electron microscopy, SEM SEMIMET, 51, 1999, pp. 225-259
Citations number
54
Categorie Soggetti
Current Book Contents
Journal title
IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS → ACNP
ISSN journal
00808784
Volume
51
Year of publication
1999
Part
B
Pages
225 - 259
Database
ISI
SICI code
0080-8784(1999)51:<225:DPISSA>2.0.ZU;2-8