Table of contents of journal:

Authors: Davies, G

Citation: G. Davies, Optical measurements of point defects, SEM SEMIMET, 51, 1999, pp. 1-92

Authors: Mooney, PM

Citation: Pm. Mooney, Defect identification using capacitance spectroscopy, SEM SEMIMET, 51, 1999, pp. 93-152

Authors: Stavola, M

Citation: M. Stavola, Vibrational spectroscopy of light element impurities in semiconductors, SEM SEMIMET, 51, 1999, pp. 153-224

Authors: Schwander, P Rau, WD Kisielowski, C Gribelyuk, M Ourmazd, A

Citation: P. Schwander et al., Defect processes in semiconductors studied at the atomic level by transmission electron microscopy, SEM SEMIMET, 51, 1999, pp. 225-259

Authors: Jager, ND Weber, ER

Citation: Nd. Jager et Er. Weber, Scanning tunneling microscopy of defects in semiconductors, SEM SEMIMET, 51, 1999, pp. 261-296

Authors: Wichert, T

Citation: T. Wichert, Perturbed angular correlation studies of defects, SEM SEMIMET, 51, 1999, pp. 297-405