Scanning tunneling microscopy of defects in semiconductors

Authors
Jager, ND Weber, ER
Citation
Nd. Jager et Er. Weber, Scanning tunneling microscopy of defects in semiconductors, SEM SEMIMET, 51, 1999, pp. 261-296
Citations number
64
Categorie Soggetti
Current Book Contents
Journal title
IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS → ACNP
ISSN journal
00808784
Volume
51
Year of publication
1999
Part
B
Pages
261 - 296
Database
ISI
SICI code
0080-8784(1999)51:<261:STMODI>2.0.ZU;2-9