Defect identification using capacitance spectroscopy

Authors
Mooney, PM
Citation
Pm. Mooney, Defect identification using capacitance spectroscopy, SEM SEMIMET, 51, 1999, pp. 93-152
Citations number
137
Categorie Soggetti
Current Book Contents
Journal title
IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS → ACNP
ISSN journal
00808784
Volume
51
Year of publication
1999
Part
B
Pages
93 - 152
Database
ISI
SICI code
0080-8784(1999)51:<93:DIUCS>2.0.ZU;2-6