Authors: Guha, S Sethuraman, A Gotkis, Y Kistler, R Steckenrider, S

Citation: S. Guha et al., Navigating yield through the maze of copper CMP defects, SOL ST TECH, 44(4), 2001, pp. 63

Authors: Kistler, R Kalnay, E Collins, W Saha, S White, G Woollen, J Chelliah, M Ebisuzaki, W Kanamitsu, M Kousky, V van den Dool, H Jenne, R Fiorino, M

Citation: R. Kistler et al., The NCEP-NCAR 50-year reanalysis: Monthly means CD-ROM and documentation, B AM METEOR, 82(2), 2001, pp. 247-267