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Results: 1-12 |
Results: 12
Impurity band in the interfacial region of GaN films grown by hydride vapor phase epitaxy
Authors: Hsu, JWP Lang, DV Richter, S Kleiman, RN Sergent, AM Look, DC Molnar, RJ
Citation: Jwp. Hsu et al., Impurity band in the interfacial region of GaN films grown by hydride vapor phase epitaxy, J ELEC MAT, 30(3), 2001, pp. 115-122
Quantum mechanical actuation of microelectromechanical systems by the Casimir force (vol 291, pg 1941, 2001)
Authors: Chan, HB Aksyuk, VA Kleiman, RN Bishop, DJ Capasso, F
Citation: Hb. Chan et al., Quantum mechanical actuation of microelectromechanical systems by the Casimir force (vol 291, pg 1941, 2001), SCIENCE, 293(5530), 2001, pp. 607-607
Quantum mechanical actuation of microelectromechanical systems by the Casimir force
Authors: Chan, HB Aksyuk, VA Kleiman, RN Bishop, DJ Capasso, F
Citation: Hb. Chan et al., Quantum mechanical actuation of microelectromechanical systems by the Casimir force, SCIENCE, 291(5510), 2001, pp. 1941-1944
Nonlinear micromechanical Casimir oscillator - art. no. 211801
Authors: Chan, HB Aksyuk, VA Kleiman, RN Bishop, DJ Capasso, F
Citation: Hb. Chan et al., Nonlinear micromechanical Casimir oscillator - art. no. 211801, PHYS REV L, 8721(21), 2001, pp. 1801
Spatial variation of electrical properties in lateral epitaxially overgrown GaN
Authors: Hsu, JWP Matthews, MJ Abusch-Magder, D Kleiman, RN Lang, DV Richter, S Gu, SL Kuech, TF
Citation: Jwp. Hsu et al., Spatial variation of electrical properties in lateral epitaxially overgrown GaN, APPL PHYS L, 79(6), 2001, pp. 761-763
Inhomogeneous spatial distribution of reverse bias leakage in GaN Schottkydiodes
Authors: Hsu, JWP Manfra, MJ Lang, DV Richter, S Chu, SNG Sergent, AM Kleiman, RN Pfeiffer, LN Molnar, RJ
Citation: Jwp. Hsu et al., Inhomogeneous spatial distribution of reverse bias leakage in GaN Schottkydiodes, APPL PHYS L, 78(12), 2001, pp. 1685-1687
Scanning capacitance microscopy imaging of silicon metal-oxide-semiconductor field effect transistors
Authors: Kleiman, RN O'Malley, ML Baumann, FH Garno, JP Timp, GL
Citation: Rn. Kleiman et al., Scanning capacitance microscopy imaging of silicon metal-oxide-semiconductor field effect transistors, J VAC SCI B, 18(4), 2000, pp. 2034-2038
Metal-insulator-semiconductor tunneling microscope: two-dimensional dopantprofiling of semiconductors with conducting atomic-force microscopy
Authors: Richter, S Geva, M Garno, JP Kleiman, RN
Citation: S. Richter et al., Metal-insulator-semiconductor tunneling microscope: two-dimensional dopantprofiling of semiconductors with conducting atomic-force microscopy, APPL PHYS L, 77(3), 2000, pp. 456-458
Nature of the highly conducting interfacial layer in GaN films
Authors: Hsu, JWP Lang, DV Richter, S Kleiman, RN Sergent, AM Molnar, RJ
Citation: Jwp. Hsu et al., Nature of the highly conducting interfacial layer in GaN films, APPL PHYS L, 77(18), 2000, pp. 2873-2875
Imaging of acoustic fields in bulk acoustic-wave thin-film resonators
Authors: Safar, H Kleiman, RN Barber, BP Gammel, PL Pastalan, J Huggins, H Fetter, L Miller, R
Citation: H. Safar et al., Imaging of acoustic fields in bulk acoustic-wave thin-film resonators, APPL PHYS L, 77(1), 2000, pp. 136-138
Electrical simulation of scanning capacitance microscopy imaging of the pnjunction with semiconductor probe tips
Authors: O'Malley, ML Timp, GL Timp, W Moccio, SV Garno, JP Kleiman, RN
Citation: Ml. O'Malley et al., Electrical simulation of scanning capacitance microscopy imaging of the pnjunction with semiconductor probe tips, APPL PHYS L, 74(24), 1999, pp. 3672-3674
Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation
Authors: O'Malley, ML Timp, GL Moccio, SV Garno, JP Kleiman, RN
Citation: Ml. O'Malley et al., Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation, APPL PHYS L, 74(2), 1999, pp. 272-274
Risultati: 1-12 |