Authors:
Browning, ND
Arslan, I
Ito, Y
James, EM
Klie, RF
Moeck, P
Topuria, T
Xin, Y
Citation: Nd. Browning et al., Application of atomic scale STEM techniques to the study of interfaces anddefects in materials, J ELEC MICR, 50(3), 2001, pp. 205-218
Citation: Rf. Klie et al., Direct observation of nanometer-scale Mg- and B-oxide phases at grain boundaries in MgB2, APPL PHYS L, 79(12), 2001, pp. 1837-1839