Authors: Frohn, JT Knapp, HF Stemmer, A

Citation: Jt. Frohn et al., Three-dimensional resolution enhancement in fluorescence microscopy by harmonic excitation, OPTICS LETT, 26(11), 2001, pp. 828-830

Authors: Schitter, G Menold, P Knapp, HF Allgower, F Stemmer, A

Citation: G. Schitter et al., High performance feedback for fast scanning atomic force microscopes, REV SCI INS, 72(8), 2001, pp. 3320-3327

Authors: Frohn, JT Knapp, HF Stemmer, A

Citation: Jt. Frohn et al., True optical resolution beyond the Rayleigh limit achieved by standing wave illumination, P NAS US, 97(13), 2000, pp. 7232-7236

Authors: Knapp, HF Stemmer, A

Citation: Hf. Knapp et A. Stemmer, Preparation, comparison and performance of hydrophobic AFM tips, SURF INT AN, 27(5-6), 1999, pp. 324-331

Authors: Jacobs, HO Knapp, HF Stemmer, A

Citation: Ho. Jacobs et al., Practical aspects of Kelvin probe force microscopy, REV SCI INS, 70(3), 1999, pp. 1756-1760

Authors: Heim, M Eschrich, R Hillebrand, A Knapp, HF Cevc, G Guckenberger, R

Citation: M. Heim et al., Hydration-scanning tunneling microscopy as a reliable method for imaging biological specimens and hydrophilic insulators, SCANNING MICROSCOPY SUPPLEMENT 10, 1996, 1996, pp. 73-80