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Results:
1-2
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Results: 2
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
Authors:
Mc Manus, MK Kash, JA Steen, SE Polonsky, S Tsang, JC Knebel, DR Huott, W
Citation:
Mk. Mc Manus et al., PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis, MICROEL REL, 40(8-10), 2000, pp. 1353-1358
S/390 G5 CMOS microprocessor diagnostics
Authors:
Song, P Motika, F Knebel, DR Rizzolo, RF Kusko, MP
Citation:
P. Song et al., S/390 G5 CMOS microprocessor diagnostics, IBM J RES, 43(5-6), 1999, pp. 899-914
Risultati:
1-2
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