AAAAAA

   
Results: 1-2 |
Results: 2
A cost effective embedded DRAM integration for high density memory and high performance logic using 0.15 mu m technology node and beyond
Authors: Ha, D Shin, D Koh, GH Lee, J Lee, S Ahn, YS Jeong, H Chung, T Kim, K
Citation: D. Ha et al., A cost effective embedded DRAM integration for high density memory and high performance logic using 0.15 mu m technology node and beyond, IEEE DEVICE, 47(7), 2000, pp. 1499-1506
Anomalous junction leakage current induced by STI dislocations and its impact on dynamic random access memory devices
Authors: Ha, D Cho, C Shin, D Koh, GH Chung, TY Kim, J
Citation: D. Ha et al., Anomalous junction leakage current induced by STI dislocations and its impact on dynamic random access memory devices, IEEE DEVICE, 46(5), 1999, pp. 940-946
Risultati: 1-2 |