Authors:
Kolesnychenko, OY
de Kort, R
van Kempen, H
Citation: Oy. Kolesnychenko et al., Atomically flat ultra-clean Cr(001) surfaces produced by cleavage of a single crystal: scanning tunneling microscopy and spectroscopy study, SURF SCI, 490(1-2), 2001, pp. L573-L578
Authors:
Kolesnychenko, OY
Toonen, AJ
Shklyarevskii, OI
van Kempen, H
Citation: Oy. Kolesnychenko et al., Millisecond dynamics of thermal expansion of mechanically controllable break junction electrodes studied in the tunneling regime, APPL PHYS L, 79(17), 2001, pp. 2707-2709
Authors:
Kolesnychenko, OY
Kolesnichenko, YA
Shklyarevskii, O
van Kempen, H
Citation: Oy. Kolesnychenko et al., Field-emission resonance measurements with mechanically controlled break junctions, PHYSICA B, 291(3-4), 2000, pp. 246-255
Authors:
Kolesnychenko, OY
Shklyarevskii, OI
van Kempen, H
Citation: Oy. Kolesnychenko et al., Calibration of the distance between electrodes of mechanically controlled break junctions using field emission resonance, REV SCI INS, 70(2), 1999, pp. 1442-1446
Authors:
Kolesnychenko, OY
Shklyarevakii, OI
van Kempen, H
Citation: Oy. Kolesnychenko et al., Giant influence of adsorbed helium on field emission resonance measurements, PHYS REV L, 83(11), 1999, pp. 2242-2245