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Results:
1-8
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Results: 8
Authors:
Koyama, T
Umeno, M
Komori, J
Mashiko, Y
Citation: T. Koyama et al., Evaluation of silicide morphology by near-infrared-laser optical-beam-induced-current technique, JPN J A P 1, 40(11), 2001, pp. 6446-6452
Authors:
Koyama, T
Umeno, M
Sonoda, K
Komori, J
Mashiko, Y
Citation: T. Koyama et al., Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique, MICROEL REL, 41(8), 2001, pp. 1243-1253
Authors:
Mazumder, MK
Yamamoto, S
Maeda, H
Komori, J
Mashiko, Y
Citation: Mk. Mazumder et al., Mechanism of pre-annealing effect on electromigration immunity of Al-Cu line, MICROEL REL, 41(8), 2001, pp. 1259-1264
Authors:
Teramoto, A
Umeda, H
Azamawari, K
Kobayashi, K
Shiga, K
Komori, J
Ohno, Y
Shigetomi, A
Citation: A. Teramoto et al., Time-dependent dielectric breakdown of SiO2 films in a wide electric fieldrange, MICROEL REL, 41(1), 2001, pp. 47-52
Authors:
Kanaya, S
Matsushita, T
Komori, J
Sarumaru, S
Isobe, H
Katayama, T
Wada, Y
Ohtoshi, M
Citation: S. Kanaya et al., Video-assisted transsternal radical esophagectomy: Three-field lymphadenectomy without thoracotomy for esophageal cancer, SURG LA E P, 9(5), 1999, pp. 353-357
Authors:
Shiga, K
Komori, J
Katsumata, M
Teramoto, A
Mashiko, Y
Citation: K. Shiga et al., Characterization of extrinsic oxide breakdown on thin dielectric oxide, IEICE TR EL, E82C(4), 1999, pp. 589-592
Authors:
Koyama, T
Sonoda, K
Komori, J
Mashiko, Y
Umeno, M
Citation: T. Koyama et al., Detection of defects in metal interconnects by the nonbias-optical beam induced current technique, J APPL PHYS, 86(11), 1999, pp. 5949-5956
Authors:
Mazumder, MK
Teramoto, A
Komori, J
Sekine, M
Kawazu, S
Mashiko, Y
Citation: Mk. Mazumder et al., Effects of N distribution on charge trapping and TDDB characteristics of N2O annealed wet oxide, IEEE DEVICE, 46(6), 1999, pp. 1121-1126
Risultati:
1-8
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