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Authors: Yoshimura, S Djayaprawira, DD Kong, TK Masuda, Y Shoji, H Takahashi, M

Citation: S. Yoshimura et al., Grain size reduction by utilizing a very thin CrW seedlayer and dry-etching process in CoCrTaNiPt longitudinal media, J APPL PHYS, 87(9), 2000, pp. 6860-6862

Authors: Yoshimura, S Djayaprawira, DD Kong, TK Masuda, Y Shoji, H Takahashi, M

Citation: S. Yoshimura et al., Media noise reduction in Co-based longitudinal media with new Co co-precipitated NiP/Al substrate, IEEE MAGNET, 36(5), 2000, pp. 2363-2365