Authors:
Ito, T
Imaizumi, M
Yamaguchi, K
Okitsu, K
Konomi, I
Yamaguchi, M
Hara, T
Ban, M
Tohkai, M
Kawamura, K
Citation: T. Ito et al., Growth rate and crystallinity of nanocrystalline silicon film grown by electron beam excited plasma chemical vapor deposition, JPN J A P 1, 39(10), 2000, pp. 6035-6036
Authors:
Awaji, N
Ozaki, S
Nishino, J
Noguchi, S
Yamamoto, T
Syoji, T
Yamagami, M
Kobayashi, A
Hirai, Y
Shibata, M
Yamaguchi, K
Liu, KY
Kawado, S
Takahashi, M
Yasuami, S
Konomi, I
Kimura, S
Hirai, Y
Hasegawa, M
Komiya, S
Hirose, T
Okajima, T
Citation: N. Awaji et al., Wavelength-dispersive total reflection X-ray fluorescence with high-brilliance undulator radiation at SPring-8, JPN J A P 2, 39(12A), 2000, pp. L1252-L1255
Citation: I. Konomi et al., Simulation of MEIS spectra for quantitative understanding of average size,composition, and size distribution of Pt-Rh alloy nanoparticles, J CATALYSIS, 192(1), 2000, pp. 11-17
Authors:
Imaizumi, M
Yamaguchi, K
Okitsu, K
Yamaguchi, M
Hara, T
Ito, T
Konomi, I
Jones, KM
Al-Jassim, MM
Citation: M. Imaizumi et al., Effects of hydrogen on the growth of nanocrystalline silicon films by electron-beam excited plasma chemical vapor deposition, J APPL PHYS, 88(11), 2000, pp. 6848-6855