Authors:
Sexton, FW
Fleetwood, DM
Shaneyfelt, MR
Dodd, PE
Hash, GL
Schanwald, LP
Loemker, RA
Krisch, KS
Green, ML
Weir, BE
Silverman, PJ
Citation: Fw. Sexton et al., Precursor ion damage and angular dependence of single event gate rupture in thin oxides, IEEE NUCL S, 45(6), 1998, pp. 2509-2518