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Results:
1-4
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Results: 4
Effect of surface proximity upon point defects in silicon
Authors:
Krishnamoorthy, V Lambers, MP Jones, KS
Citation:
V. Krishnamoorthy et al., Effect of surface proximity upon point defects in silicon, DEFECT DIFF, 183-1, 2000, pp. 189-198
Energy dependence of transient enhanced diffusion and defect kinetics
Authors:
Saleh, H Law, ME Bharatan, S Jones, KS Krishnamoorthy, V Buyuklimanli, T
Citation:
H. Saleh et al., Energy dependence of transient enhanced diffusion and defect kinetics, APPL PHYS L, 77(1), 2000, pp. 112-114
Effect of the end-of-range loop layer depth on the evolution of {311} defects
Authors:
Raman, R Law, ME Krishnamoorthy, V Jones, KS
Citation:
R. Raman et al., Effect of the end-of-range loop layer depth on the evolution of {311} defects, APPL PHYS L, 74(5), 1999, pp. 700-702
Effect of surface proximity on end-of-range loop dissolution in silicon
Authors:
Raman, R Law, ME Krishnamoorthy, V Jones, KS Herner, SB
Citation:
R. Raman et al., Effect of surface proximity on end-of-range loop dissolution in silicon, APPL PHYS L, 74(11), 1999, pp. 1591-1593
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