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Results: 1-3 |
Results: 3
Tail bit implications in advanced 2 transistors-flash memory device reliability
Authors: Scarpa, A Tao, G Dijkstra, J Kuper, FG
Citation: A. Scarpa et al., Tail bit implications in advanced 2 transistors-flash memory device reliability, MICROEL ENG, 59(1-4), 2001, pp. 183-188
The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors
Authors: Golo, NT van der Wal, S Kuper, FG Mouthaan, T
Citation: Nt. Golo et al., The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors, MICROEL REL, 41(9-10), 2001, pp. 1391-1396
Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations
Authors: Mouthaan, AJ Salm, C Lunenborg, MM de Wolf, MARC Kuper, FG
Citation: Aj. Mouthaan et al., Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations, MICROEL REL, 40(6), 2000, pp. 909-917
Risultati: 1-3 |