Authors: Kyung, H Yoon, CS Kim, CK

Citation: H. Kyung et al., Oxidation mechanism of the insulation layer in NiFe/Co/Al(Ta)-oxide/Co magnetic tunnel junctions, MAT SCI E B, 83(1-3), 2001, pp. 192-197

Authors: Kim, CK Kyung, H Yoon, CS

Citation: Ck. Kim et al., Non-equilibrium crystallization diagram for the Co75.26-xFe4.74(BSi)(20+x)amorphous metal alloys, J MATER SCI, 36(19), 2001, pp. 4611-4616

Authors: Kyung, H Ahn, HS Yoon, CS Kim, CK Song, O Miyazaki, T Ando, Y Kubota, H

Citation: H. Kyung et al., Effect of microstructure on the magnetoresistive properties of NiFe/Co(CoFe)/Al(Ta)-oxide/Co(CoFe) tunnel junctions, J APPL PHYS, 89(5), 2001, pp. 2752-2755

Authors: Kyung, H Kim, CK

Citation: H. Kyung et Ck. Kim, Microstructural evolution of duplex grain structure and interpretation of the mechanism for NiO scales grown on pure Ni- and Cr-doped substrates during high temperature oxidation, MAT SCI E B, 76(3), 2000, pp. 173-183