Authors: LABBELAVIGNE S BARRET S GARET F DUVILLARET L COUTAZ JL

Citation: S. Labbelavigne et al., FAR-INFRARED DIELECTRIC-CONSTANT OF POROUS SILICON LAYERS MEASURED BYTERAHERTZ TIME-DOMAIN SPECTROSCOPY, Journal of applied physics, 83(11), 1998, pp. 6007-6010