Authors: OSBORN JV LACOE RC MAYER DC YABIKU G

Citation: Jv. Osborn et al., TOTAL-DOSE HARDNESS OF 3 COMMERCIAL CMOS MICROELECTRONICS FOUNDRIES, IEEE transactions on nuclear science, 45(3), 1998, pp. 1458-1463

Authors: WANGRATKOVIC J LACOE RC MACWILLIAMS KP SONG MY BROWN S YABIKU G

Citation: J. Wangratkovic et al., NEW UNDERSTANDING OF LDD NMOS HOT-CARRIER DEGRADATION AND DEVICE LIFETIME AT CRYOGENIC TEMPERATURES, Microelectronics and reliability, 37(10-11), 1997, pp. 1747-1754

Authors: WITCZAK SC SCHRIMPF RD FLEETWOOD DM GALLOWAY KF LACOE RC MAYER DC PUHL JM PEASE RL SUEHLE JS

Citation: Sc. Witczak et al., HARDNESS ASSURANCE TESTING OF BIPOLAR JUNCTION TRANSISTORS AT ELEVATED IRRADIATION TEMPERATURES, IEEE transactions on nuclear science, 44(6), 1997, pp. 1989-2000