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EBERHARDT W
KESSLER B
LADE H
RADERMACHER K
WIECHER DU
WILSON H
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RAVET MF
ROUSSEAUX F
CHEN Y
HAGHIRIGOSNET AM
CARCENAC F
DECANINI D
BOURNEIX J
LAUNOIS H
BACHMANN PK
LADE H
WIECHERT DU
WILSON H
Citation: Mf. Ravet et al., EVALUATION OF A DIAMOND-BASED X-RAY MASK FOR HIGH-RESOLUTION X-RAY PROXIMITY LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 3055-3060
Authors:
BACHMANN PK
HAGEMANN HJ
LADE H
LEERS D
WIECHERT DU
WILSON H
FOURNIER D
PLAMANN K
Citation: Pk. Bachmann et al., THERMAL-PROPERTIES OF C H-GROWN, C/H/O-GROWN, C/H/N-GROWN AND C/H/X-GROWN POLYCRYSTALLINE CVD DIAMOND/, DIAMOND AND RELATED MATERIALS, 4(5-6), 1995, pp. 820-826
Authors:
BACHMANN PK
BAUSEN HD
LADE H
LEERS D
WIECHERT DU
HERRES N
KOHL R
KOIDL P
Citation: Pk. Bachmann et al., RAMAN AND X-RAY STUDIES OF POLYCRYSTALLINE CVD DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 3(11-12), 1994, pp. 1308-1314