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Results: 1-2 |
Results: 2
COMPARISON OF SUBMICRON PARTICLE ANALYSIS BY AUGER-ELECTRON SPECTROSCOPY, TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, AND SECONDARY-ELECTRON MICROSCOPY WITH ENERGY-DISPERSIVE X-RAY SPECTROSCOPY
Authors: CHILDS KD NARUM D LAVANIER LA LINDLEY PM SCHUELER BW MULHOLLAND G DIEBOLD AC
Citation: Kd. Childs et al., COMPARISON OF SUBMICRON PARTICLE ANALYSIS BY AUGER-ELECTRON SPECTROSCOPY, TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, AND SECONDARY-ELECTRON MICROSCOPY WITH ENERGY-DISPERSIVE X-RAY SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(4), 1996, pp. 2392-2404
BACKSCATTERING LIMITATIONS TO SPATIAL-RESOLUTION IN THE AUGER MICROPROBE
Authors: OLSON RR LAVANIER LA NARUM DH
Citation: Rr. Olson et al., BACKSCATTERING LIMITATIONS TO SPATIAL-RESOLUTION IN THE AUGER MICROPROBE, Applied surface science, 70-1, 1993, pp. 266-272
Risultati: 1-2 |