Citation: O. Leifeld et al., A UHV STM FOR IN-SITU CHARACTERIZATION OF MBE CVD GROWTH ON 4-INCH WAFERS/, Applied physics A: Materials science & processing, 66, 1998, pp. 993-997
Authors:
BUDA B
WANG C
WREDE W
LEIFELD O
AS DJ
SCHIKORA D
LISCHKA K
Citation: B. Buda et al., THE INFLUENCE OF THE EARLY-STAGE OF ZNSE GROWTH ON GAAS(001) ON THE DEFECT-RELATED LUMINESCENCE, Semiconductor science and technology, 13(8), 1998, pp. 921-926