Authors: FOURCHES N DELAGNES E LEMEUR LP ORSIER E DEPONTCHARRA J TRUCHE R

Citation: N. Fourches et al., ORIGIN OF MACROSCOPIC EFFECTS ON HARDENED MOSFET DEVICES FOLLOWING LOW-TEMPERATURE (90 K) IONIZING IRRADIATION, Microelectronic engineering, 28(1-4), 1995, pp. 75-78