Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-1
|
Results: 1
EFFICIENT TEST-POINT SELECTION FOR SCAN-BASED BIST
Authors:
TSAI HC CHENG KTT LIN CJM BHAWMIK S
Citation:
Hc. Tsai et al., EFFICIENT TEST-POINT SELECTION FOR SCAN-BASED BIST, IEEE transactions on very large scale integration (VLSI) systems, 6(4), 1998, pp. 667-676
Risultati:
1-1
|