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Results: 2
OBSERVATION OF 2 TYPES OF TRAPPING CENTERS IN THIN-FILM TRANSISTORS USING CHARGE-PUMPING TECHNIQUE
Authors: BALASINSKI A WORLEY J HUANG KW WALTERS J LIOU FT
Citation: A. Balasinski et al., OBSERVATION OF 2 TYPES OF TRAPPING CENTERS IN THIN-FILM TRANSISTORS USING CHARGE-PUMPING TECHNIQUE, IEEE electron device letters, 16(10), 1995, pp. 460-462
IDENTIFICATION OF SI SIO2 INTERFACE PROPERTIES IN THIN-FILM TRANSISTORS WITH CHARGE-PUMPING TECHNIQUE/
Authors: BALASINSKI A WORLEY J HUANG KW LIOU FT
Citation: A. Balasinski et al., IDENTIFICATION OF SI SIO2 INTERFACE PROPERTIES IN THIN-FILM TRANSISTORS WITH CHARGE-PUMPING TECHNIQUE/, Journal of the Electrochemical Society, 142(8), 1995, pp. 2717-2721
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