Authors: NGUYEN TK LANDSBERGER LM JEAN C LOGIUDICE V

Citation: Tk. Nguyen et al., EFFECTS OF FLUORINE IMPLANTS ON INDUCED CHARGE COMPONENTS IN GATE-OXIDES UNDER CONSTANT-CURRENT FOWLER-NORDHEIM STRESS, I.E.E.E. transactions on electron devices, 44(9), 1997, pp. 1432-1440

Authors: NGUYEN TK LANDSBERGER LM LOGIUDICE V JEAN C

Citation: Tk. Nguyen et al., ELECTRICAL CHARACTERIZATION OF FLUORINE-IMPLANTED GATE OXIDE STRUCTURES, Canadian journal of physics, 74, 1996, pp. 74-78