Authors:
KIDD P
DUNSTAN DJ
COLSON HG
LOURENCO MA
SACEDON A
GONZALEZSANZ F
GONZALEZ L
GONZALEZ Y
GARCIA R
GONZALEZ D
PACHECO FJ
GOODHEW PJ
Citation: P. Kidd et al., COMPARISON OF THE CRYSTALLINE QUALITY OF STEP-GRADED AND CONTINUOUSLYGRADED INGAAS BUFFER LAYERS, Journal of crystal growth, 169(4), 1996, pp. 649-659
Citation: Ma. Lourenco et Dj. Dunstan, INTERPRETATION OF DOUBLE-CRYSTAL X-RAY ROCKING CURVES IN RELAXED STRAINED-LAYER STRUCTURES, Journal of applied physics, 79(6), 1996, pp. 3011-3015
Authors:
ALVAREZ AL
CALLE F
WAGNER J
SACEDON A
MAIER M
DEAVILA SF
LOURENCO MA
CALLEJA E
MUNOZ E
Citation: Al. Alvarez et al., INFLUENCE OF IN ON SI LOCAL VIBRATIONAL-MODES IN INXGA1-XAS ESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.12), Journal of applied physics, 76(12), 1994, pp. 7797-7804
Citation: Ma. Lourenco et Kp. Homewood, PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY OF SEMICONDUCTORS - AN ANALYSIS OF LIFETIME DISTRIBUTIONS, Semiconductor science and technology, 8(7), 1993, pp. 1277-1282
Citation: Ma. Lourenco et al., EVALUATION OF SILICON-ON-INSULATOR SUBSTRATES USING PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY, Journal of applied physics, 74(11), 1993, pp. 6754-6758