Authors:
JAYJOCK MA
REINERT KH
SCRIBNER HE
BOYCE SD
ELLIS HM
FREDERICK CB
LARKIN RH
LYNCH WT
MAHER KV
WEILER ED
Citation: Ma. Jayjock et al., TOTAL QUALITY MANAGEMENT OF THE PRODUCT RISK ASSESSMENT PROCESS, American Industrial Hygiene Association journal, 58(11), 1997, pp. 814-819
Authors:
HSIA SL
MCGUIRE GE
TAN TY
SMITH PL
LYNCH WT
Citation: Sl. Hsia et al., HIGH-RESISTIVITY CO AND TI SILICIDE FORMATION ON SILICON-ON-INSULATORSUBSTRATES, Thin solid films, 253(1-2), 1994, pp. 462-466