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Results: 1-4 |
Results: 4

Authors: Lades, M Wachutka, G
Citation: M. Lades et G. Wachutka, Electrothermal analysis of SiC power devices using physically-based devicesimulation, SOL ST ELEC, 44(2), 2000, pp. 359-368

Authors: Lades, M Berz, D Schmid, U Sheppard, ST Kaminski, N Wondrak, W Wachutka, G
Citation: M. Lades et al., Numerical simulation of implanted top-gate GH-SiC JFET characteristics, MAT SCI E B, 61-2, 1999, pp. 415-418

Authors: Kaindl, W Lades, M Kaminski, N Niemann, E Wachutka, G
Citation: W. Kaindl et al., Experimental characterization and numerical simulation of the electrical properties of nitrogen, aluminum, and boron in 4H/6H-SiC, J ELEC MAT, 28(3), 1999, pp. 154-160

Authors: Lades, M Kaindl, W Kaminski, N Niemann, E Wachutka, G
Citation: M. Lades et al., Dynamics of incomplete ionized dopants and their impact on 4H/6H-SiC devices, IEEE DEVICE, 46(3), 1999, pp. 598-604
Risultati: 1-4 |