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Results:
1-7
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Results: 7
Authors:
Baikie, ID
Peterman, U
Lagel, B
Dirscherl, K
Citation: Id. Baikie et al., Study of high- and low-work-function surfaces for hyperthermal surface ionization using an absolute Kelvin probe, J VAC SCI A, 19(4), 2001, pp. 1460-1466
Authors:
Kim, JS
Lagel, B
Moons, E
Johansson, N
Baikie, ID
Salaneck, WR
Friend, RH
Cacialli, F
Citation: Js. Kim et al., Kelvin probe and ultraviolet photoemission measurements of indium tin oxide work function: a comparison, SYNTH METAL, 111, 2000, pp. 311-314
Authors:
Baikie, ID
Petermann, U
Speakman, A
Lagel, B
Dirscherl, KM
Estrup, PJ
Citation: Id. Baikie et al., Work function study of rhenium oxidation using an ultra high vacuum scanning Kelvin probe, J APPL PHYS, 88(7), 2000, pp. 4371-4375
Authors:
Petermann, U
Baikie, ID
Lagel, B
Citation: U. Petermann et al., Kelvin probe study of metastable states during initial oxygen adsorption dynamics on Si(111) 7 x 7, THIN SOL FI, 344, 1999, pp. 492-494
Authors:
Baikie, I
Petermann, U
Lagel, B
Citation: I. Baikie et al., UHV-compatible spectroscopic scanning Kelvin probe for surface analysis, SURF SCI, 435, 1999, pp. 249-253
Authors:
Lagel, B
Baikie, ID
Petermann, U
Citation: B. Lagel et al., A novel detection system for defects and chemical contamination in semiconductors based upon the Scanning Kelvin Probe, SURF SCI, 435, 1999, pp. 622-626
Authors:
Baikie, ID
Petermann, U
Lagel, B
Citation: Id. Baikie et al., In situ work function study of oxidation and thin film growth on clean surfaces, SURF SCI, 435, 1999, pp. 770-774
Risultati:
1-7
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