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Laidler, H
Telling, ND
Wu, SZ
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Hughes, T
Laidler, H
O'Grady, K
Petford-Long, AK
Mao, SN
Kief, M
Linville, E
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Citation: L. Holloway et H. Laidler, Measurement of stacking fault densities in CoCrPt thin film media using grazing incidence x-ray scattering, J APPL PHYS, 87(9), 2000, pp. 5690-5692
Authors:
Dova, P
Laidler, H
O'Grady, K
Toney, MF
Doerner, MF
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